2010 Winter Symposium: Industry Issue - Review

Attack of the Clones - Fake Software & Hardware and the price we pay

Presenter: Phil Bunch, Phase Design

Cloned products of all types are widespread in Asia. In our industry, cloned test and measurement equipment is causing widepsread problems - for the OEMS, system integrators and everyone else along the way as well as, obviously. the original T&M equipment manufacturers.

Phil Bunch will introduced the problem and share some of the issues that this was causing. He suggested some steps that we as an industry can take to help reduce this problem. This was followed by an open discussion on the subject with a view to coming up with some recommendations that ALMA can publish to encourage our members to join together to reduce this problem.

Although many ideas were suggested, we still need your input, and we would particularly like input from people who did not manage to make it to the event. Please visit the ALMA forum (registration required) where you can download Phil's presentation and continue the discussions.

Discuss this issue on the ALMA Forum

ALMA Winter Symposium 2010 Review:
Main  | Training  |  Papers  |  Tutorials |  Round Table  |  Panel Discussion  |  Industry Issue | Exhibit Hall | Members Dinner